Category:Scanning probe microscopy

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This category contains articles about the different types of scanning probe microscopes and methods associated with them.

The main article for this category is Scanning probe microscopy.

Wikimedia Commons has media related to:
Scanning probe microscopy

Pages in category "Scanning probe microscopy"

The following 24 pages are in this category, out of 24 total. Updates to this list can occasionally be delayed for a few days.

  • Scanning probe microscopy

A

  • Atomic force microscope

B

  • Ballistic electron emission microscopy

D

  • Dip-Pen Nanolithography

E

  • Electrochemical scanning tunneling microscope
  • Electrostatic force microscope

F

  • Feature-oriented positioning
  • Feature-oriented scanning

F cont.

  • Friction force microscope

K

  • Kelvin probe force microscope

M

  • Magnetic force microscope
  • Magnetic resonance force microscopy
  • Millipede memory

N

  • Near-field scanning optical microscope

P

  • Photothermal microspectroscopy
  • Picosecond ultrasonics

S

  • Scanning Hall probe microscope

S cont.

  • Scanning capacitance microscopy
  • Scanning gate microscopy
  • Scanning ion-conductance microscopy
  • Scanning probe lithography
  • Scanning tunneling microscope
  • Scanning voltage microscopy
  • Spin polarized scanning tunneling microscopy
Categories: Microscopy | Nanotechnology
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  • This page was last modified 20:44, 27 May 2008 by Wikipedia user Peter G Werner. Based on work by Wikipedia user(s) BotMultichill, SkierRMH, Jcwf, IanOsgood and Antony-22.
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