Talk:Wafer (electronics)

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Contents 1 Grammar question 2 proposed merges 3 Possibly dated information 4 Standard Wafer Sizes

[edit] Grammar question

In the context of electronics, is it permissible to use "wafer" as an uncountable noun? For instance, "we examined the effects of various slurry components on silicon wafer." Just curious... -- Visviva 04:52, 28 April 2006 (UTC)

I've never heard it used in that context. If I saw that written, I would assume it was written by a non-native English speaker. --Phil Holmes 11:58, 30 April 2006 (UTC)

A web search shows plenty of usage in both forms. I think it is ok as quoted above - they're examining effects on a material (silicon wafer), not on some specific wafers or on silicon in general.Lisamh 22:14, 17 September 2006 (UTC)

[edit] proposed merges

I think the Wafer prober article could best be merged into Wafer testing.Lisamh 22:16, 17 September 2006 (UTC)

I don't think so. —Preceding unsigned comment added by 84.83.197.159 (talk • contribs) 02:32, 30 October 2006

Vote for merge. DFH 22:09, 2 January 2007 (UTC)

Hi! m:Voting is evil.  :) (It's better to reach concensus through discussion.) I think Wafer prober and Wafer testing should both be merged into the Wafer (electronics). They're all about the same thing (wafers), so it makes sense to have them in one article. Since they're so closely related, they share a lot of the same terminology, and the articles will benefit from integrated context. They're all currently stubs or near-stubs, so putting them together yields one article of a better length, rather than three too-short articles. If, over time, it gets fleshed out to the point where it gets unwieldy, then we can do a split into sub-articles or whatever, as needed. If people think the articles shoukd not be merged, please explain why. Thanks! —DragonHawk (talk) 05:44, 17 January 2007 (UTC)

Oppose. A prober is a distinct piece of equipment, like an electron microscope, and fully deserves its own article. -- Atlant 20:50, 25 January 2007 (UTC)

Oppose. Wafer probing and wafer testing would be better suited under microfabrication or Semiconductor_manufacturing. The wafers article is about the wafers themselves, not about all the processes used to make circuits. Wafer probing/testing is a bit of a misnomer because its not the wafers being probed/tested but the circuits that were built from the wafers. Dspark76 (talk) 01:32, 24 February 2008 (UTC)

[edit] Possibly dated information

The article mentions the following: "This wafermap is then sent by a network or floppy disk to the die attachment process" Is that current? because I can't imagine floppies being used. Perhaps someone that has more recent familiarity to production could correct this if needed. Wwhat (talk) 17:33, 10 December 2007 (UTC)

[edit] Standard Wafer Sizes

Many modern fabs have moved to 300mm wafers; this should be added to the list of wafer sizes. Many of the smaller sizes shown may not be considered standard anymore! -- Gretchenpatti (talk) 18:26, 4 January 2008 (UTC)