Image:SEM SE vs BE Zr Al.png

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SEM_SE_vs_BE_Zr_Al.png‎ (400 × 270 pixels, file size: 67 KB, MIME type: image/png)

[edit] Summary

The image illustrates two different scanning modes of a scanning electron microscope (SEM). In the lower part of the image, we can see the relief of the sample. This is obtained using the detection of secondary electrons. In the upper part of the image, we can see light spots surrounded by darker areas. The light spots correspond to the zirconium aggregates in an aluminium matrix. This is obtained using the detection of backscattered electrons.

Author: Twisp

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	Date/Time	Dimensions	User	Comment
current	12:22, 12 December 2007	400×270 (67 KB)	Twisp (Talk \| contribs)	(The image illustrates two different scanning modes of a scanning electron microscope (SEM). In the lower part of the image, we can see the relief of the sample. This is obtained using the detection of secondary electrons. In the upper part of the image, w)