Image:AFMimageRoughGlass20x20.png

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Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20 µm x 20 µm x 420 nm). The AFM used was the Veeco di CP-II, scanned in contact mode.

Constructed at the Nanorobotics Laboratory at Carnegie Mellon University (http://nanolab.me.cmu.edu).

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current03:02, 6 October 2005401×326 (187 KB)Chych (Talk | contribs) (Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM used was the Veeco di CP-I)

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